Correlation between 1064 nm laser attack and thermal behavior in STT-MRAM
| Autor: | Yazigy, N., Postel-Pellerin, J., Marca, V. Della, Sousa, R.C., Di Pendina, G., Canet, P. |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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