Precise estimation of dynamic junction temperature of SiC transistors for lifetime prediction of power modules used in three-phase inverters
| Autor: | Teixeira, Alice, Cougo, Bernardo, Segond, Gilles, Morais, Lenin M.F., Andrade, Marco, Tran, Duc Hoan |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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