Single event burnout failures caused in silicon and silicon carbide power devices by single alpha particles emitted from radioactive nuclides
| Autor: | Pocaterra, Marco, Ciappa, Mauro ⁎ |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect