Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation
| Autor: | Mo, Rigen, Li, Pengwei, Lyu, He, Mei, Bo, Sun, Yi, Yu, Qingkui, Cao, Shuang, Wang, Qianyuan, Zhang, Hongwei |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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