DC to AC analysis of HC vs. BTI damage in N-EDMOS used in single photon avalanche diode cell
| Autor: | Pitard, H., Bravaix, A., Federspiel, X., Fillon, R., Cacho, F. |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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