Modelling SiC MOSFET module threshold voltage (VTH) and impact of parallel device ΔVTH on short circuit robustness
| Autor: | Deb, A., Gonzalez, J. Ortiz, Jahdi, S., Taha, M., Mawby, P.A., Alatise, O. |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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