Study of different parameters influencing IGBT and diode robustness under short-circuit type III conditions
| Autor: | Mysore, M.L., Maitra, A., Basler, T., Lutz, J., Baburske, R., Niedernostheide, F.-J., Schulze, H.-J., Pfirsch, F. |
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| Zdroj: | In Microelectronics Reliability November 2023 150 |
| Databáze: | ScienceDirect |
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