Numerical modeling of FS-trench IGBTs by TCAD and its parameter extraction method

Autor: Ma, Xiao, Huang, Yongle, Tang, Xin, Luo, Yifei, Shen, Haonan, Xiao, Fei
Zdroj: In Microelectronics Reliability August 2023 147
Databáze: ScienceDirect