SEU performance of Schmitt-trigger-based flip-flops at the 22-nm FD SOI technology node
| Autor: | Li, Zongru, Elash, Christopher, Jin, Chen, Chen, Li, Wen, Shi-Jie, Fung, Rita, Xing, Jiesi, Shi, Shuting, Yang, Zhi Wu, Bhuva, Bharat L. |
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| Zdroj: | In Microelectronics Reliability July 2023 146 |
| Databáze: | ScienceDirect |
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