Analysis of resistive defects on a foundry 8T SRAM-based IMC architecture
| Autor: | Ammoura, L., Flottes, M.-L., Girard, P., Noel, J.-P., Virazel, A. |
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| Zdroj: | In Microelectronics Reliability August 2023 147 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Ammoura, L., Flottes, M.-L., Girard, P., Noel, J.-P., Virazel, A. |
|---|---|
| Zdroj: | In Microelectronics Reliability August 2023 147 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect