Lifetime prediction for press pack IGBT device by considering fretting wear failure
| Autor: | Yao, Ran, Duan, Zeyu, Li, Hui, Iannuzzo, Francesco, Lai, Wei, Chen, Xianping |
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| Zdroj: | In Microelectronics Reliability June 2023 145 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect