Self-healing behaviors of metallized high-temperature dielectric films for capacitor applications
| Autor: | Zhu, Jiafeng, Tong, Hui, Cao, Shimo, Luo, Jinpeng, Liu, Xuepeng, Xu, Ju, Oleksandr, Moliar, Peng, Wenfei |
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| Zdroj: | In Microelectronics Reliability May 2023 144 |
| Databáze: | ScienceDirect |
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