Impact of interface trap charges on analog/RF and linearity performances of PGP negative capacitance FET
| Autor: | Chaudhary, Shalini, Dewan, Basudha, Singh, Devenderpal, Sahu, Chitrakant, Yadav, Menka |
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| Zdroj: | In Microelectronics Reliability April 2023 143 |
| Databáze: | ScienceDirect |
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