Temperature distribution in multichip IGBT module and its impact on collector current sharing
Autor: | Chen, Cuili, Pickert, Volker, Al-Greer, Maher, Wang, Zhiqiang, Knoll, Alois Christian |
---|---|
Zdroj: | In Microelectronics Reliability April 2023 143 |
Databáze: | ScienceDirect |
Externí odkaz: |