Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects
| Autor: | Allegro, Paula R.P., Toufen, Dennis L., Aguiar, Vitor A.P., dos Santos, Lucas S.A., de Oliveira, William N., Added, Nemitala, Medina, Nilberto H., Macchione, Eduardo L.A., Alberton, Saulo G., Guazzelli, Marcilei A., Melo, Marco A.A., Oliveira, Juliano A. |
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| Zdroj: | In Microelectronics Reliability March 2023 142 |
| Databáze: | ScienceDirect |
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