A shared page-aware machine learning assisted method for predicting and improving multi-level cell NAND flash memory life expectancy

Autor: Santikellur, Pranesh, Buddhanoy, Matchima, Sakib, Sadman, Ray, Biswajit, Chakraborty, Rajat Subhra
Zdroj: In Microelectronics Reliability January 2023 140
Databáze: ScienceDirect