A shared page-aware machine learning assisted method for predicting and improving multi-level cell NAND flash memory life expectancy
Autor: | Santikellur, Pranesh, Buddhanoy, Matchima, Sakib, Sadman, Ray, Biswajit, Chakraborty, Rajat Subhra |
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Zdroj: | In Microelectronics Reliability January 2023 140 |
Databáze: | ScienceDirect |
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