A degradation model for separable electrical contacts based on the failure caused by surface oxide film
| Autor: | Zhong, Liqiang, Fan, Xing, Han, Kunkun, Chen, Wenhua, Qian, Ping |
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| Zdroj: | In Microelectronics Reliability December 2022 139 |
| Databáze: | ScienceDirect |
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