Thermal fatigue analysis of gold wire bonding solder joints in MEMS pressure sensors by thermal cycling tests

Autor: Zhang, Yunfan, Wu, Kangkang, Li, Hui, Shen, Shengnan, Cao, Wan, Li, Feng, Han, Jinzhe
Zdroj: In Microelectronics Reliability December 2022 139
Databáze: ScienceDirect