Impact of unpreventable induced interface trapped charges on HZO based FDSOI NCFET
| Autor: | Seshu, Vullakula Rama, Shaik, Rameez Raja, Pradhan, K.P. |
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| Zdroj: | In Microelectronics Reliability December 2022 139 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Seshu, Vullakula Rama, Shaik, Rameez Raja, Pradhan, K.P. |
|---|---|
| Zdroj: | In Microelectronics Reliability December 2022 139 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect