Hot-carrier reliability and performance study of transistors with variable gate-to-drain/source overlap
| Autor: | Devoge, P., Aziza, H., Lorenzini, P., Masson, P., Julien, F., Marzaki, A., Malherbe, A., Delalleau, J., Cabout, T., Regnier, A., Niel, S. |
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| Zdroj: | In Microelectronics Reliability November 2022 138 |
| Databáze: | ScienceDirect |
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