New measurement method to investigated service life of protection networks exposed to ESD
| Autor: | Ruffat, F., Caignet, F., Boyer, A., Escudié, F., Mejecaze, G., Puybaret, F. |
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| Zdroj: | In Microelectronics Reliability November 2022 138 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect