Soft error mechanism in SOI D flip-flop induced by space electrostatic discharge
| Autor: | Yuan, Run-Jie, Chen, Rui, Han, Jian-Wei, Wang, Xuan, Chen, Qian, Liang, Ya-Nan, Zhou, Jie |
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| Zdroj: | In Microelectronics Reliability September 2022 136 |
| Databáze: | ScienceDirect |
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