Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications
| Autor: | Mitrović, N., Veljković, S., Davidović, V., Djorić-Veljković, S., Golubović, S., Živanović, E., Prijić, Z., Danković, D. |
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| Zdroj: | In Microelectronics Reliability November 2022 138 |
| Databáze: | ScienceDirect |
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