Dynamic high temperature operating life test methodology for long-term switching reliability of GaN power devices
| Autor: | Tayyab, Muhammad Farhan, Silvestri, Marco, Bernardoni, Mirko, Basler, Thomas, Curatola, Gilberto |
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| Zdroj: | In Microelectronics Reliability November 2022 138 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect