Influence of LDD spacers on total ionizing dose response of the transconductance for bulk MOSFETs working at cryogenic temperatures
| Autor: | Cussac, G., Nuns, T., Ducret, S., Duzellier, S., Artola, L. |
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| Zdroj: | In Microelectronics Reliability August 2022 135 |
| Databáze: | ScienceDirect |
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