A new mixed hardening methodology applied to a 28 nm FDSOI 32-bits DSP subjected to gamma radiation
| Autor: | Acuña, A. Ureña, Armani, J.M., Slimani, M., Miro-Panades, I., Dollfus, P. |
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| Zdroj: | In Microelectronics Reliability November 2021 126 |
| Databáze: | ScienceDirect |
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