Single event effects of SiC diode demonstrated by pulsed-laser two photon absorption
| Autor: | Shangguan, ShiPeng, Ma, YingQi, Han, JianWei, Cui, YiXin, Wang, YingHao, Chen, Rui, Liang, YaNan, Zhu, Xiang, Li, Yue |
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| Zdroj: | In Microelectronics Reliability October 2021 125 |
| Databáze: | ScienceDirect |
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