Memoryless linearity in undoped and B-doped graphene FETs: A relative investigation to report improved reliability

Autor:	Chandrasekar, L., Pradhan, K.P.
Zdroj:	In Microelectronics Reliability October 2021 125
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect