Electrical overstress effect characterization on Power MOS Trenchfet and correlation with time dependent dielectric breakdown
| Autor: | Mazza, B., Patanè, S., Cordiano, F., Giliberto, M., Barletta, G., Franco, G. |
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| Zdroj: | In Microelectronics Reliability October 2021 125 |
| Databáze: | ScienceDirect |
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