Research on single event effect test of a RRAM memory and space flight demonstration
| Autor: | Lyu, He, Zhang, Hongwei, Mei, Bo, Yu, Qingkui, Mo, Rigen, Sun, Yi, Gao, Wu |
|---|---|
| Zdroj: | In Microelectronics Reliability November 2021 126 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect