Optically induced static power in combinational logic: Vulnerabilities and countermeasures
Autor: | Bělohoubek, Jan, Fišer, Petr, Schmidt, Jan |
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Zdroj: | In Microelectronics Reliability September 2021 124 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Bělohoubek, Jan, Fišer, Petr, Schmidt, Jan |
---|---|
Zdroj: | In Microelectronics Reliability September 2021 124 |
Databáze: | ScienceDirect |
Externí odkaz: |