Measurement and simulation of short circuit current sharing under parallel connection: SiC MOSFETs and SiC Cascode JFETs
| Autor: | Wu, R., Agbo, S.N., Mendy, S., Bashar, E., Jahdi, S., Gonzalez, Ortiz, Alatise, O. |
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| Zdroj: | In Microelectronics Reliability November 2021 126 |
| Databáze: | ScienceDirect |
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