A method to improve the accuracy and efficiency for metallized-film capacitor's reliability assessment using joint simulation
| Autor: | Yin, Jinpeng, Liu, Jinjun, Zhang, Yan, Lv, Chunlin |
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| Zdroj: | In Microelectronics Reliability November 2021 126 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect