Study on the high-temperature triggering and holding characteristics of PDSOI SCR devices
| Autor: | Wang, J.X., Zhao, F.Z., Ni, T., Li, D.L., Gao, L.C., Wang, J.J., Li, X.J., Zeng, C.B., Luo, J.J., Han, Z.S. |
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| Zdroj: | In Microelectronics Reliability November 2021 126 |
| Databáze: | ScienceDirect |
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