SEE evaluation of ARM M0 cores in a 28 nm FDSOI technology
| Autor: | Shi, S.-T., Liu, R., Evans, A., Li, X.-T., Zheng, Y.-L., Chen, L., Glorieux, M., Sanchez, A.J., Wong, R., Wen, S.-J., Cunha, J., Guo, G., Ferlet-Cavrois, V., Summerer, L., Entrena, L. |
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| Zdroj: | In Microelectronics Reliability August 2021 123 |
| Databáze: | ScienceDirect |
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