The impact of self-heating and its implications on hot-carrier degradation – A modeling study
| Autor: | Tyaginov, S., Makarov, A., Chasin, A., Bury, E., Vandemaele, M., Jech, M., Grill, A., De Keersgieter, A., Linten, D., Kaczer, B. |
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| Zdroj: | In Microelectronics Reliability July 2021 122 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect