A remaining useful life prediction method of IGBT based on online status data
| Autor: | Zhang, Jinli, Hu, Jinbao, You, Hailong, Jia, Renxu, Wang, Xiaowen, Zhang, Xiaowen |
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| Zdroj: | In Microelectronics Reliability June 2021 121 |
| Databáze: | ScienceDirect |
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