Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis

Autor:	Yang, Weitao, Du, Boyang, He, Chaohui, Sterpone, Luca
Zdroj:	In Microelectronics Reliability May 2021 120
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect