Testing single via related defects in digital VLSI designs

Autor:	Mirabella, Nunzio, Ricci, Maurizio, Calà, Ignazio, Lanza, Roberto, Grosso, Michelangelo
Zdroj:	In Microelectronics Reliability May 2021 120
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect