Soft errors in DNN accelerators: A comprehensive review
| Autor: | Ibrahim, Younis, Wang, Haibin, Liu, Junyang, Wei, Jinghe, Chen, Li, Rech, Paolo, Adam, Khalid, Guo, Gang |
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| Zdroj: | In Microelectronics Reliability December 2020 115 |
| Databáze: | ScienceDirect |
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