Mechanistic study of copper wire-bonding failures on packaging devices in acidic chloride environments

Autor: Ross, Nick, Asokan, Muthappan, Ashok Kumar, Goutham Issac, Caperton, Joshua, Alptekin, John, Salunke, Ashish Shivaji, Chyan, Oliver M.
Zdroj: In Microelectronics Reliability October 2020 113
Databáze: ScienceDirect