Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model process
| Autor: | Ye, Xuerong, Chen, Hao, Sun, Qisen, Chen, Cen, Niu, Hao, Zhai, Guofu, Li, Wenwen, Yuan, Ruiming |
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| Zdroj: | In Microelectronics Reliability November 2020 114 |
| Databáze: | ScienceDirect |
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