Prediction of solar particle events with SRAM-based soft error rate monitor and supervised machine learning
| Autor: | Chen, J., Lange, T., Andjelkovic, M., Simevski, A., Krstic, M. |
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| Zdroj: | In Microelectronics Reliability November 2020 114 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect