The interfacial reaction and microstructure of Co/In/Cu sputtering target assembly after soldering

Autor: Liu, Zhi-Quan, Meng, Zhi-Chao, Wu, Di, Shang, Zhengang, He, Xin, Xiong, Xiaodong
Zdroj: In Microelectronics Reliability October 2020 113
Databáze: ScienceDirect