Proton-induced single-event effects on 28 nm Kintex-7 FPGA
| Autor: | Wang, Zibo, Chen, Wei, Yao, Zhibin, Zhang, Fengqi, Luo, Yinhong, Tang, Xiaobin, Guo, Xiaoqiang, Ding, Lili, Peng, Cong |
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| Zdroj: | In Microelectronics Reliability April 2020 107 |
| Databáze: | ScienceDirect |
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