Long term accelerated ageing of an ASIC dedicated to cryptographic application

Autor: Coutet, Julien, Doche, Emmanuel, Guetard, Romain, Janvresse, Aurelien, Lavagne, Suzel, Lebosse, Pierre, Pastre, Antonin, Sarlotte, Michel, Moreau, Christian, Marc, François, Bayle, Franck
Zdroj: In Microelectronics Reliability September 2019 100-101
Databáze: ScienceDirect