Long term accelerated ageing of an ASIC dedicated to cryptographic application
Autor: | Coutet, Julien, Doche, Emmanuel, Guetard, Romain, Janvresse, Aurelien, Lavagne, Suzel, Lebosse, Pierre, Pastre, Antonin, Sarlotte, Michel, Moreau, Christian, Marc, François, Bayle, Franck |
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Zdroj: | In Microelectronics Reliability September 2019 100-101 |
Databáze: | ScienceDirect |
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