Investigation of repetitive short-circuit operation of 1200 V IGBTs in the IC-VCE phase space
| Autor: | Bhojani, R., Baburske, R., Mysore, M.L., Kowalsky, J., Lutz, J., Niedernostheide, F.J., Schulze, H.J. |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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