Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
| Autor: | Goerl, Roger, Villa, Paulo, Vargas, Fabian L., Marcon, César A., Medina, Nilberto H., Added, Nemitala, Guazzelli, Marcilei A. |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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Full Text from ScienceDirect