Fault resilient FPGA design for 28 nm ZYNQ system-on-chip based radiation monitoring system at CERN
| Autor: | Toner, C., Boukabache, H., Ducos, G., Pangallo, M., Danzeca, S., Widorski, M., Roesler, S., Perrin, D. |
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| Zdroj: | In Microelectronics Reliability September 2019 100-101 |
| Databáze: | ScienceDirect |
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